FURTHER READING


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FURTHER READING
FURTHER READING Agrawal, V., ATT Bell Labs, general reference papers website: http://www.informatik.unitrier.de/~ley/db/indices/atree/a/Agrawal:Vishwani_=.html. Bozturk, Cagatay, "Burn-in, Reliability Testing, and Manufacturing of Semiconductors," research paper, Kent State University, 2006. Burns, M. and G. W. Roberts, An Introduction to Mixed Signal IC Test and Measurement, Oxford University Press, New York, 2001. Bushnell, M. L., D. Vishwani, and V. Agrawal,
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. FURTHER READING, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export