ATE DATA FORMATS


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ATE DATA FORMATS
ATE DATA FORMATSIn a manufacturing test program flow, the device under test is set up with levels, timing, pattern, analog waveform, and RF signals. The tester then measures the response of the DUT. Depending on the test the measured result is a pass/fail flag, digitized current/voltage, or a measurement of a frequency. The result is logged in a file and at the end of production the lot summary is saved with the test data for later analysis by the semiconductor manufacturer. The data formats used for test input and output are mostly custom and defined by the tester manufacturer. However, there are several common formats including a standard for pattern data that allow test engineers to port test vectors and timing. For test results, there is test data format (STDF), which is used by device manufact…
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. ATE DATA FORMATS, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export