DESIGN DIAGNOSTIC EQUIPMENT


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DESIGN DIAGNOSTIC EQUIPMENT
DESIGN DIAGNOSTIC EQUIPMENTThese are classified into circuit probers and modification tools. Circuit probers are beam (E-beam or laser)–based systems used in R&D for failure analysis during new silicon bring-up or root causing field returns due to failure in the system. Modification tools are focused ion beam (FIB) systems used for circuit edits while debugging new silicon, saving the designer time and money.
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. DESIGN DIAGNOSTIC EQUIPMENT, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export