BURN-IN TESTER


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BURN-IN TESTER
BURN-IN TESTERBurn-in is an electrical stress test that employs voltage and temperature to accelerate the electrical failure of a device. Burn-in essentially simulates the operating life of the device, since the electrical excitation applied during burn-in may mirror the worst-case bias that the device will be subjected to in the course of its useable life. Depending on the burn-in duration used, the reliability information obtained may pertain to the device's early life or its wear-out. Burn-in may be used as a reliability monitor or as a production screen to weed out potential infant mortalities from the lot. Burn-in is usually done at 125°C, with electrical excitation applied to the samples. The burn-in process is facilitated by using burn-in boards where the sam…
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. BURN-IN TESTER, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export