DIGITAL TESTER


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DIGITAL TESTER
DIGITAL TESTER
Digital Testing Historically, logic devices followed the discrete device design in the early 1960s. Early testers designed for testing digital devices used a stored program memory which essentially verifies the truth table of combinational logic circuits by applying patterns on the input pins of the DUT and comparing the sampled logic levels of the output pins to the expected pattern stored in the program memory. This simple digital tester gave rise to the development of most of the rest of the ATE concepts over the past five decades. Digital data has two states—on/off, high/low, or logic "1" or "0." A stimulus on one or more of the inputs to the device causes a result on one or more of the outputs of the de…
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. DIGITAL TESTER, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export