REFERENCES


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REFERENCES
REFERENCES See http://www.jedec.org/. Reliability standards are in http://www.jedec.org/standards-documents/results/reliability. JEDEC/FSA joint publication. Foundry Process Qualification Guidelines (wafer fabrication manufacturing sites), jp001.01, section 8.1. May 2004. Ilan A. Blech and Harry Sello, "The Failure of Thin Aluminum Current-Carrying Strips on Oxidized Silicon," IEEE, Fifth Annual Symposium on the Physics of Failure in Electronics, Piscataway, NJ, pp. 496–505, 1966.
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. REFERENCES, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export