ELECTROMIGRATION


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ELECTROMIGRATION
ELECTROMIGRATIONElectromigration is a physical phenomenon that results from the transfer of momentum between the charge carriers and the conductor medium. In a way it is similar to erosion, where the flow of water over a hard rock is capable of forming the Grand Canyon. Electromigration was identified as a failure mechanism for interconnects by I. A. Blech and H. Sello in 1966.3 In interconnects the conductor medium is a metal, typically Cu or Al, and the charge carriers are electrons. As electrons flow through the medium they collide with the stationary metal atoms. The accumulated momentum transfer creates a drift of atoms in the direction of the electron wind, opposite to the direction of the curr…
Citation
Hwaiyu Geng, CMfgE, PE: Semiconductor Manufacturing Handbook, Second Edition. ELECTROMIGRATION, Chapter (McGraw-Hill Professional, 2018 2005), AccessEngineering Export