Silicon Debug and Test


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Silicon Debug and Test
10106021031600Silicon Debug and Test
<emphasis role="bold">Overview</emphasis> This chapter discusses how completed die are tested. The chapter describes the validation of the design, the root causes and the fixing of design bugs, and the testing flow to identify manufacturing defects.
<emphasis role="bold">Objectives</emphasis>
Citation
Grant McFarland: Microprocessor Design: A Practical Guide from Design Planning to Manufacturing. Silicon Debug and Test, Chapter (McGraw-Hill Professional, 2006), AccessEngineering Export