SCANNING ELECTRON MICROSCOPY AND X-RAY ANALYSIS


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SCANNING ELECTRON MICROSCOPY AND X-RAY ANALYSIS
John R. Devaney HI-REL Laboratories 1010608SCANNING ELECTRON MICROSCOPY AND X-RAY ANALYSIS
<emphasis role="italic"><emphasis role="bold">HISTORY OF MICROSCOPY</emphasis></emphasis> Scanning electron microscopy (SEM) has been heralded as one of the most significant inspection and analytical tools to evolve since mankind first aided eyesight with globes…
Citation
Perry L. Martin: Electronic Failure Analysis Handbook: Techniques and Applications for Electronic and Electrical Packages, Components, and Assemblies. SCANNING ELECTRON MICROSCOPY AND X-RAY ANALYSIS, Chapter (McGraw-Hill Professional, 1999), AccessEngineering Export